High Voltage Vlf Hipot Instrument

Applications

A high voltage VLF (Very Low Frequency) hipot instrument is a testing device used to apply high voltage to electrical equipment to ensure its insulation is able to withstand the operating voltage. VLF testing is commonly used for cables, transformers, switchgear, and other high voltage equipment.

Parameter

  1. Output voltage ratings: 30kV
  2. Output frequency: 0.1Hz, 0.05Hz, 0.02Hz
  3. Measurement accuracy: 3%
  4. Positive and negative voltage peak errors: ≤ 3%
  5. Voltage wave form distortion: ≤ 5%
  6. Use condition: indoor and outdoor; temperature: -10℃+40℃
  7. Humidity: ≤ 85%RH
  8. Power: AC50Hz, 220V ±5%

Advantages

The ultra-low frequency withstand voltage test device combines modern digital frequency conversion advanced technology, adopts microcomputer control, and is fully automated in boosting, reducing, measuring, and protecting. It can also undergo manual intervention during the automatic boosting process. Due to its fully electronic design, it has a small size, light weight, large screen LCD display, clear and intuitive display, and can display output waveforms and test reports on a printer.

Description

Mainly used for voltage withstand testing of polyethylene insulated power cables, and can also be used for insulation voltage withstand testing of large power transformers. The ultra-low frequency withstand voltage test device uses ultra-low frequency and high voltage to test the withstand voltage of power cables, which is a new method. When conducting power frequency AC withstand voltage tests on large generators, cables, and other test objects, the ultra-low frequency withstand voltage test device requires a large test transformer or resonant transformer due to the large capacitance of their insulation layer. These huge devices are not only bulky, expensive, but also very inconvenient to use. In order to solve this contradiction, the power department has adopted a method of reducing the test frequency, thereby reducing the current and the capacity of the test power supply.

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